Reminders:

For participants who need a visa, please contact xrm2012@sinap.ac.cn to ask for the invitation letter at your earliest convenience.

The oral talks will be selected against evaluation of abstracts. For the abstracts which do NOT receive a talk will be automatically transferred to poster contributions.

Welcome!

The international Conference on X-ray microscopy (XRM) started in Göttingen in 1983. It has been held every third year from 1987, then every second year after 2008, considering its significance and broad interest to X-ray imaging and technique.

XRM 2012 will be held from 5 to 10 August 2012 in Shanghai. The event is organized by the Shanghai Synchrotron Radiation Facility (SSRF) and the National Synchrotron Radiation Laboratory (NSRL). It aims to provide up-to-date information on the theoretical approaches and experimental developments in high resolution x-ray imaging and all techniques devoted to the observation of microstructures using X-rays as a probe.

Looking forward to meeting you in Shanghai!

Topics

• Facilities, Instruments, and Optics
• X‐ray Microscopy Methods  and Techniques
• Bio-Science
• Physics and Material Science
• Environmental and Energy Science